Cyclotron resonance of two-dimensional electrons in a Si quantum well

We have performed the cyclotron resonance (CR) measurements on two-dimensional electrons in a Si quantum well. At the electron density View the MathML source, both the CR scattering time τCR and the transport scattering time τt exhibit a metallic temperature dependence down to 0.5 K.The ratio of τt/τCR at 0.4 K shows the positive Ns dependence in the measured Ns region.