Title of article
Designing of silicon effective quantum dots by using the oxidation-induced strain: a theoretical approach
Author/Authors
Kenji Shiraishi، نويسنده , , Masao Nagase، نويسنده , , Seiji Horiguchi، نويسنده , , Hiroyuki Kageshima، نويسنده , , Masashi Uematsu، نويسنده , , Yasuo Takahashi، نويسنده , , Katsumi Murase، نويسنده ,
Issue Information
دوهفته نامه با شماره پیاپی سال 2000
Pages
5
From page
337
To page
341
Abstract
We have investigated using partial oxidation of an Si wire for forming quantum dots. Calculated results show oxidation induced strain leads to the formation of effective quantum dots, although actual dot-shaped structures are not formed. By investigating formation conditions, we have found that partial oxidation of an Si wire on a (0 0 1) substrate is very efficient for the formation of oxidation-induced effective quantum dots. Moreover, our calculated results are qualitatively consistent with experimental results obtained with our Si single-electron transistors (Si-SET) fabricated by pattern-dependent oxidation (PADOX).
Keywords
Strain , Silicon single-electron transistor , Oxidation , Theory , Quantum dots
Journal title
Physica E Low-dimensional Systems and Nanostructures
Serial Year
2000
Journal title
Physica E Low-dimensional Systems and Nanostructures
Record number
1049739
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