Title of article
Evidence of the Coulomb gap observed in an InAs inserted In0.53Ga0.47As/In0.52Al0.48As heterostructure
Author/Authors
Can-Ming Hu، نويسنده , , Junsaku Nitta، نويسنده , , Tatsushi Akazaki، نويسنده , , Hideaki Takayanagi، نويسنده ,
Issue Information
دوهفته نامه با شماره پیاپی سال 2000
Pages
4
From page
795
To page
798
Abstract
We report studies of the in-plane magneto-transport properties of a 2DEG in an InAs inserted InGaAs/InAlAs heterostructure with a DC bias voltage. Temperature dependent zero-bias reduction of the longitudinal resistance was observed when high magnetic field is applied along the sample growth direction. We interpret the observed resistance reduction as the result of a Coulomb gap existing at the Fermi level of the 2DEG.
Keywords
2DEG , Coulomb gap , Electron density of states
Journal title
Physica E Low-dimensional Systems and Nanostructures
Serial Year
2000
Journal title
Physica E Low-dimensional Systems and Nanostructures
Record number
1049834
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