Title of article
Cyclotron resonance for 2D electrons on helium films above rough substrates
Author/Authors
A Würl، نويسنده , , J Klier، نويسنده , , P Leiderer، نويسنده , , V Shikin، نويسنده ,
Issue Information
دوهفته نامه با شماره پیاپی سال 2003
Pages
2
From page
184
To page
185
Abstract
An investigation of the microwave absorption for two-dimensional electron systems (2DES) on helium films and in the presence of a cyclotron resonance (CR) magnetic field are presented. Measured data are explained by a recently proposed two-fraction model of the 2DES, which makes the general structure of the microwave absorption understandable. The fraction of localized and free electrons can be precisely determined and its dependence on the thickness of the helium film above the roughness of the underlying solid substrate is understood.
Keywords
Surface roughness , Cyclotron resonance , 2D electron systems , Thin helium films
Journal title
Physica E Low-dimensional Systems and Nanostructures
Serial Year
2003
Journal title
Physica E Low-dimensional Systems and Nanostructures
Record number
1050719
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