Title of article
Scanning gate measurements in the quantum Hall regime at 300 mK
Author/Authors
S. Kicin، نويسنده , , A Pioda، نويسنده , , T Ihn، نويسنده , , K Ensslin، نويسنده , , D.D Driscoll، نويسنده , , A.C. Gossard، نويسنده ,
Issue Information
دوهفته نامه با شماره پیاپی سال 2004
Pages
4
From page
708
To page
711
Abstract
Scanning gate measurements have been performed on a shallow two-dimensional electron gas in a Ga[Al]As heterostructure in the quantum Hall regime at View the MathML source. This technique uses the local electrostatic potential induced by the conducting tip of a scanning force microscope for influencing the resistance of mesoscopic structures. Applied at high magnetic fields and low temperatures on a Hall bar sample, it is a further development of previous backscattering experiments with spatially immobile gates. This technique gives insight into the nature of the states in the interior and at the edges of a Hall bar with a width of View the MathML source.
Keywords
Quantum Hall effect , Scanning gate technique , Edge states , Scanning probe techniques
Journal title
Physica E Low-dimensional Systems and Nanostructures
Serial Year
2004
Journal title
Physica E Low-dimensional Systems and Nanostructures
Record number
1051060
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