Title of article
CHARACTERIZATION OF THE SUSCEPTIBILITY OF INTEGRATED CIRCUITS WITH INDUCTION CAUSED BY HIGH POWER MICROWAVES
Author/Authors
By S.-M. Hwang، نويسنده , , J.-I. Hong، نويسنده , , and C.-S. Huh ، نويسنده ,
Issue Information
ماهنامه با شماره پیاپی سال 2008
Pages
12
From page
61
To page
72
Abstract
This paper examines malfunction and destruction of semiconductors by high power microwaves. The experiments employ a waveguide and a magnetron to study the influence of high power microwaves on TTL/CMOS IC inverters. The TTL/CMOS IC inverters are composed
Journal title
Progress In Electromagnetics Research
Serial Year
2008
Journal title
Progress In Electromagnetics Research
Record number
1054646
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