Evaluation of luminescence decay measurements probed on pure and doped Pt(IV) hexahalogeno complexes I. Exponential rise time and decay curves applying various statistical tests Original Research Article

Statistical methods are shown to be superior for evaluating luminescence lifetime curves of complex compounds to usual regression procedures. A simple model for the intensity change with time valid for the rise time and the decay period of emission is proposed which considers contributions of exponential decay in time intervals which compare to the time resolution of the equipment available. Mean square fittings to measured points furnish lifetimes and amplitudes of multi-exponential model functions (hypotheses) which are tested applying various statistical methods. Well-established procedures as residual analysis, the autocorrelation function, chi-square test, Durbin-Watson and the Run test are used for investigating whether the results are normal distributed and autocorrelated. For physical interpretation a hypothesis function is only acceptable if all test statistics support non-rejection. Curve fitting and statistical checks are applied on low-temperature lifetime measurements carried out on various Pt(IV) hexahalogeno complexes. Pure materials and compounds doped in suitable host crystals supply essentially identical decay parameters.