Title of article
Analysis of continuous stiffness data measured during nanoindentation of titanium films on glass substrate
Author/Authors
Tao Wen، نويسنده , , Jianghong Gong، نويسنده , , Zhijian Peng، نويسنده , , Danyu Jiang، نويسنده , , Chengbiao Wang، نويسنده , , Zhiqiang Fu، نويسنده , , Hezhuo Miao، نويسنده ,
Issue Information
دوهفته نامه با شماره پیاپی سال 2011
Pages
5
From page
500
To page
504
Abstract
An empirical function was proposed to describe the continuous stiffness curves, i.e., image versus h (where Er is the reduced modulus, H is the composite hardness and h is the indenter penetration depth), measured with nanoindentation tests for titanium films on glass substrate. By analyzing the variations of the parameters included in this empirical equation with film thickness, the physical meanings of this empirical equation were discussed. It was shown that the mechanical properties of the substrate and the film may be extracted from such analyses.
Keywords
Interfaces , Nanoindentation , Thin film , Continuous stiffness measurement
Journal title
Materials Chemistry and Physics
Serial Year
2011
Journal title
Materials Chemistry and Physics
Record number
1059157
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