• Title of article

    Rapid ultraviolet-curing of epoxy siloxane films

  • Author/Authors

    Pei-I Wang، نويسنده , , Justin Bult، نويسنده , , Rajat Ghoshal، نويسنده , , Ram Ghoshal، نويسنده , , Toh-Ming Lu، نويسنده ,

  • Issue Information
    دوهفته نامه با شماره پیاپی سال 2011
  • Pages
    5
  • From page
    678
  • To page
    682
  • Abstract
    The ultraviolet (UV) curable epoxy siloxane polymer is shown to cross-link at low UV dosages of 130 mJ/cm2, making it desirable for use in nanoimprinting and the rapid fabrication of micro/nano-scaled patterns. In this paper, the dielectric and mechanical properties of this UV-cured epoxy siloxane polymer are investigated. The results of these tests show that the rapid UV-cured polymer films have a dielectric constant of 2.7 ± 0.13, leakage current density on the order of 10−9 A/cm2 under 1 MV/cm, dielectric strength of greater than 5 MV/cm, and a reduced modulus of elasticity of 6.2 GPa characterized using nanoindentation. These properties indicate that the epoxy siloxane can be used to fabricate layers for functional device applications.
  • Keywords
    Epoxy siloxane , UV curable polymer , Nanoidentation , Imprint lithography
  • Journal title
    Materials Chemistry and Physics
  • Serial Year
    2011
  • Journal title
    Materials Chemistry and Physics
  • Record number

    1059360