Title of article :
Preparation and characterization of nanocrystalline CdSe thin films deposited by SILAR method
Author/Authors :
H.M. Pathan b، نويسنده , , B.R Sankapal، نويسنده , , J.D Desai، نويسنده , , C.D. Lokhande، نويسنده ,
Issue Information :
دوهفته نامه با شماره پیاپی سال 2003
Pages :
4
From page :
11
To page :
14
Abstract :
The successive ionic layer adsorption and reaction (SILAR) method has been used for the first time to deposit nanocrystalline CdSe thin film onto glass substrates. The SILAR method is a modified version of chemical bath deposition (CBD) method in a way that substrates are immersed in cations and anions alternatively and film growth takes place on the substrates. The preparative conditions such as concentration, pH, temperature, immersion time, immersion cycles, etc. are optimized to get nanocrystalline CdSe films. The films are characterized by high resolution transmission electron micrograph (HRTEM), energy dispersive X-ray analysis (EDAX), X-ray diffraction, optical absorption and electrical resistivity measurements.
Keywords :
Nanocrystalline thin film , SILAR method , CdSe
Journal title :
Materials Chemistry and Physics
Serial Year :
2003
Journal title :
Materials Chemistry and Physics
Record number :
1061072
Link To Document :
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