Study of Al–Ti/Si bi-layer as the recording media for write-once HD-DVD optical disks

Optimum structure for HD-DVD optical disks containing Al–Ti/Si bi-layer recording system was identified by reflectivity simulation and dynamic test of disk samples. For the disk sample with optimized structure, the maximum partial response signal-to-noise ratio (PRSNR) of 19.1 dB, minimum simulated bit error rate (sbER) of 1.7 × 10−7 and modulation >0.6 were achieved at the writing power (Pw) = 11.2 mW. Transmission electron microscopy (TEM) revealed that the polycrystalline granular clusters constitute the recording marks. Subsequent analyses evidenced that element mixing/alloy reactions occur in between Si and Al–Ti layers and the formation of Al3.21Si0.47 crystalline phase is responsible for the signal recording in the disk samples.