• Title of article

    Surface roughness factor of anodic oxide layer for electrolytic capacitors

  • Author/Authors

    Han-Jun Oh، نويسنده , , Gyeong-Su Park، نويسنده , , Jung-Gu Kim، نويسنده , , Yongsoo Jeong، نويسنده , , Choong-Soo Chi، نويسنده ,

  • Issue Information
    دوهفته نامه با شماره پیاپی سال 2003
  • Pages
    4
  • From page
    331
  • To page
    334
  • Abstract
    The roughness factor of barrier-type anodic oxide layer with low electrical conductivity was evaluated using electrochemical measurement in electrolyte with redox couple. To evaluate the surface roughness factor, the surface of barrier-type oxide layer was covered with thin layer of platinum by sputtering. From the limiting diffusion current method the surface roughness factor of barrier-type Al2O3 estimated to be 1.03. This factor is in good agreement with the results of the cross-sectional characteristics by using transmission electron microscope.
  • Keywords
    Electrochemical techniques , Aluminum oxide , Dielectric properties , Capacitance
  • Journal title
    Materials Chemistry and Physics
  • Serial Year
    2003
  • Journal title
    Materials Chemistry and Physics
  • Record number

    1061889