Title of article :
Photoreactive molecular layers containing aryl ester units: Preparation, UV patterning and post-exposure modification
Author/Authors :
Thomas H?fler، نويسنده , , Anna M. Track، نويسنده , , Peter Pacher، نويسنده , , Quan Shen، نويسنده , , Heinz-Georg Flesch، نويسنده , , Gregor Hlawacek، نويسنده , , Georg Koller، نويسنده , , Michael G. Ramsey، نويسنده , , Robert Schennach، نويسنده , , Roland Resel، نويسنده , , Christian Teichert، نويسنده , , Wolfgang Kern، نويسنده , , Gregor Trimmel، نويسنده , , Thomas Griesser، نويسنده ,
Issue Information :
دوهفته نامه با شماره پیاپی سال 2010
Pages :
7
From page :
287
To page :
293
Abstract :
The photolithographic modification of thin functional silane layers provides a versatile and powerful means of fabricating functionalized patterned surfaces which can be applied for tuning inorganic surface properties and for modern immobilisation techniques. In this contribution we present the synthesis of a new functional trichloro organosilane bearing photoreactive aryl ester groups and its application in thin silane layers on silicon oxide surfaces. Whereas the trichlorosilyl group acts as anchoring unit to the inorganic surface, the aryl ester group undergoes the photo-Fries rearrangement to yield hydroxyketones upon irradiation with UV-light of 254 nm which leads to a change in chemical reactivity of the surface. By a subsequent reaction with perfluorobutyryl chloride, the photogenerated hydroxy groups yield the corresponding perfluorinated ester compound, which allows further tuning of surface properties. The layer formation as well as the photoreaction and post-modification reaction was monitored by FTIR spectroscopy and X-ray photoelectron spectroscopy (XPS). The thickness of the obtained thin layers was determined by X-ray reflectivity (XRR). Photopatterned surfaces were produced using a contact mask during illumination followed by the post-modification reaction. Friction force microscopy (FFM) revealed the contrast between modified and unmodified regions of the patterned samples.
Keywords :
Thin films , Lithography , Atomic force microscopy (AFM) , Infrared spectroscopy (IR)
Journal title :
Materials Chemistry and Physics
Serial Year :
2010
Journal title :
Materials Chemistry and Physics
Record number :
1062124
Link To Document :
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