Preparation of (Ni0.5Zn0.5)Fe2O4/Pb(Zr0.53Ti0.47)O3 thick films and their magnetic and ferroelectric properties

By engrafting Pb(Zr0.53Ti0.47)O3 (PZT) sol–gel solution into (Ni0.5Zn0.5)Fe2O4 (NZFO) and PZT bulk ceramic powder to form hybrid homogeneous/heterogeneous slurries, NZFO/PZT multiferroic thick films with different PZT ferroelectric slurry layers are successfully prepared onto Pt/Ti/SiO2/Si substrate at low temperature of 600 °C through spin coating technique. The film thicknesses are ranging from 1 μm to 5 μm dependence on PZT slurry layer. Due to the centre-distribution of NZFO particles in the PZT matrix, only pure PZT perovskite phase is observed in the resultant multiferroic thick films by X-ray diffraction (XRD). Scanning Electron Microscope (SEM) results suggest an optimized process of PZT slurry to film surface. However, over many this slurry layer will decrease both saturated magnetization and remanent polarization and increase their leakage currents due to enhanced porosities introduced by additional PZT slurry layers. Finally, the most suitable number of PZT layer in the multiferroic composite thick films which can compromise the ferroelectric and magnetic properties as well as a low leakage, are concluded as 2 layers. Detailed physical mechanism is also discussed.