Title of article :
Energy band diagrams for the photo-electrochemical dissolution of n-Si(1 0 0) in HF
Author/Authors :
Wern-Dare Jehng، نويسنده , , Jing-Chie Lin، نويسنده , , Chien-Ming Lai، نويسنده , , Sheng-Long Lee، نويسنده ,
Issue Information :
دوهفته نامه با شماره پیاپی سال 2005
Pages :
5
From page :
513
To page :
517
Abstract :
A technique in combination of theoretical and experimental methods was used to establish the energy band diagrams for the photo-electrochemical dissolution of n-Si(1 0 0) in various HF solutions. Based on theoretical calculation in the band gap of silicon and experimental measurements in both open circuit potential (OCP) and flatband voltage (Vfb) of the n-Si/HF, we successfully established the energy band diagrams, and estimated the activation energy (Eact) for the photo-electrochemical reaction of the system. The Eact data were advantageous to elucidate the reaction kinetics. The dissolution rate of silicon increased to a maximum with increasing the HF concentration from 0.5 to 2.0 M; it decreased with further increasing in HF concentrations. This concentration effect could be interpreted in terms of energy band diagrams and the Eact data.
Keywords :
Energy band diagram , Silicon , Photo-electrochemical techniques , Etching
Journal title :
Materials Chemistry and Physics
Serial Year :
2005
Journal title :
Materials Chemistry and Physics
Record number :
1063395
Link To Document :
بازگشت