Title of article
Optical analysis of Ge19Se81−xSbx thin films using single transmission spectrum
Author/Authors
Neha Sharma، نويسنده , , Sunanda Sharda، نويسنده , , VINEET SHARMA، نويسنده , , S. K. Ghosh and Pankaj Sharma ، نويسنده ,
Issue Information
دوهفته نامه با شماره پیاپی سال 2012
Pages
6
From page
967
To page
972
Abstract
Chalcogenides are promising material for various optical applications. Transmission spectra of thermally evaporated thin film of Ge19Se81−xSbx (where x = 0, 4, 8, 12, 16, 17.2, 20) have been obtained in the spectral range of 400–2400 nm. Refractive index has been found to increase with increase in Sb content while optical band gap has been found to decrease up to x = 17.2 and thereafter increases. The results have been explained on the basis of change in the density of dangling bonds. Results indicate that the observed characteristics favour the application of these materials in optical filters.
Keywords
Thin films , Chalcogenides , Optical materials , Defects
Journal title
Materials Chemistry and Physics
Serial Year
2012
Journal title
Materials Chemistry and Physics
Record number
1064971
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