Effect of composition and forming parameter on evaporated Ag–As–Te thin films

The effect of increasing Ag content on the conduction phenomena of AgxAs50−xTe50 with 3 ≤ x ≤ 20 glass system of thickness ≈150 nm is investigated. The optical constants (refractive index (n), extinction coefficient (K), real and imaginary part of dielectric constant) have been analyzed. The values of (n) decreases with incident photon energy, the results are interpreted in terms of the change in concentration of localized states due to the shift in Fermi level. A correlation between the electrical, optical constants and cohesive energy has been estimated. In addition, the analysis of the results suggests that the effect of Ag content increasing electronic conduction of the system.