Title of article
Study on twin stacking faults in ultrafine nickel
Author/Authors
Ping Liu، نويسنده , , Yuming Wang، نويسنده ,
Issue Information
دوماهنامه با شماره پیاپی سال 2000
Pages
3
From page
155
To page
157
Abstract
We study the existence and the formation mechanism of twin stacking faults in ultrafine particle Ni produced by arc method in this paper. Both XRD (X-ray diffraction) method and TEM (transmission electron microscope) measurement are used to determine the existence of twin.
Keywords
XRD , TEM , Twin stacking faults
Journal title
Materials and Design
Serial Year
2000
Journal title
Materials and Design
Record number
1066645
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