Title of article
Investigation of microstructures in a Fe/Al2O3/Fe tunneling junction prepared using the ion-beam sputtering technique
Author/Authors
G Ni، نويسنده , , Q.Y Xu، نويسنده , , H Sang، نويسنده , , J.M. Zhu، نويسنده , , Y.W. Du، نويسنده ,
Issue Information
ماهنامه با شماره پیاپی سال 2001
Pages
4
From page
399
To page
402
Abstract
A series of Fe/Al2O3/Fe tunneling junction samples were fabricated using the ion beam sputtering technique. The microstructures of these samples were analyzed using X-ray photoelectron spectroscopy (XPS), atomic force microscopy (AFM), and high resolution transmission electronic microscopy (HRTEM). The results show that Al2O3 layers are well formed in the sample, but that an interdiffusion exists mainly at the interface between the bottom Fe and Al2O3 layers.
Keywords
Magnetic tunneling junction , Microstructure , Interdiffusion
Journal title
Materials and Design
Serial Year
2001
Journal title
Materials and Design
Record number
1066753
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