Title of article
Analysis of mode characteristics for equilateral triangle semiconductor microlasers with imperfect boundaries
Author/Authors
Y.-Z.، Huang, نويسنده , , Q.-Y.، Lu, نويسنده , , W.-H.، Guo, نويسنده , , L.-J.، Yu, نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2004
Pages
-201
From page
202
To page
0
Abstract
The influence of imperfect boundaries on the mode quality factor is investigated for equilateral-triangle-resonator (ETR) semiconductor microlasers by the finite difference time domain technique and the Pade approximation with Bakerʹs algorithm. For 2-D ETR with a refractive index of 3.2 and side length of 5 (mu)m, the confined modes can still have a quality factor of about 1000 as small triangles with side length of 1 (mu)m are cut from the vertices of the ETR. For a deformed 5 (mu)m ETR with round vertices and curve sides, the simulated mode quality factors are comparable to the measured results.
Keywords
Distributed systems
Journal title
IEE PROCEEDINGS OPTOELECTRONICS
Serial Year
2004
Journal title
IEE PROCEEDINGS OPTOELECTRONICS
Record number
106883
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