Title of article :
A new analytical method for stress intensity factors based on in situ measurement of crack deformation under biaxial tension
Author/Authors :
J.G. Wang، نويسنده , , D.Y. Ju، نويسنده , , M.J. Sun، نويسنده , , S.L. Li، نويسنده ,
Issue Information :
ماهنامه با شماره پیاپی سال 2011
Pages :
7
From page :
664
To page :
670
Abstract :
A new approach for the calculation of stress intensity factors (SIF) for isotropic and orthotropic materials under biaxial tension loading was proposed in this paper. In order to determine SIF from the full-field displacement data, an asymptotic expansion of the crack tip displacement field was performed. The deforming shape and surface residual stress of the crack tip was obtained at the early extended stage of the loading process by using optical microscope and X-ray diffraction measurement. During this stage, a modified Dugdale Model, which takes into account the coupled effect at the crack tip, was proposed for the open displacement of the crack tip. In this paper, the SIFs of two types of silicon steel sheet with isotropic and orthotropic properties were calculated using the modified Dugdale Model based on the biaxial tension experimental data. From the results, it was found that analysis using the modified Dugdale Model is an effective way to evaluate SIF under biaxial stress.
Keywords :
Biaxial tension , Insitu observation , Stress intensity factor
Journal title :
Materials and Design
Serial Year :
2011
Journal title :
Materials and Design
Record number :
1069496
Link To Document :
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