Title of article :
Acid colloidal silica slurry for Cu CMP
Author/Authors :
Kim، Nam Hoon نويسنده , , Chang، Eui-Goo نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2004
Abstract :
Semi-abrasive free slurry for copper chemical mechanical planarisation (CMP) with below 0.5% acid colloidal silica provides good hydrogen peroxide stability, excellent colloidal silica dispersion ability and easiness of post-CMP cleaning. This approach may be useful for the application of singleand first-step copper CMP slurry with one package system.
Journal title :
IEE Electronics Letters
Journal title :
IEE Electronics Letters