Title of article :
1530 V, 16.8 m(omega) . cm/sup 2/, 4H-SiC normally-off vertical junction field-effect transistor
Author/Authors :
J.H.، Feng Yan   Zhao, نويسنده , , M.، Weiner, نويسنده , , L.G.، Fursin, نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2004
Pages :
-26
From page :
27
To page :
0
Abstract :
The fabrication and characterisation of a 4H-SiC double-gated, normally-off vertical junction field-effect transistor (VJFET) without epitaxial regrowth, with an implanted vertical channel, is reported. A blocking voltage of 1530 V in the normally-off mode has been achieved with a drift layer of 15 (mu)m using a two-step junction termination extension. The VJFET shows a low specific on-resistance R/sub ON_SP/ of 16.8 m(omega) . cm/sup 2/.
Keywords :
Hydrograph
Journal title :
IEE Electronics Letters
Serial Year :
2004
Journal title :
IEE Electronics Letters
Record number :
107126
Link To Document :
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