Author/Authors :
M.S.، Shur, نويسنده , , R.، Gaska, نويسنده , , N.، Pala, نويسنده , , S.L.، Rumyantsev, نويسنده , , J.، Sinius, نويسنده , , S.، Talapatra, نويسنده ,
Abstract :
A report is presented on the electrical and structural properties of Cu/sub 7/S/sub 4/ films deposited on polyimide substrate at temperatures close to room temperature using the water solutions of complex-salt compounds. The X-ray diffraction data identified Cu/sub 7/S/sub 4/ crystalline monoclinic structure. The resistance of the film increased by 350% under tensile strain and by 5% under compressive strain. Maximal value of the gauge factor was found to be G~10/sup 3/.