Title of article :
Ultrafast CMOS inverter with 4.7 ps gate delay fabricated on 90 nm SOI technology
Author/Authors :
H.، Jackel, نويسنده , , F.، Ellinger, نويسنده , , L.C.، Rodoni, نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2004
Pages :
-1250
From page :
1251
To page :
0
Abstract :
Very low gate delays of 7.7 ps at 1 V supply and 4.7 ps at 2 V supply have been achieved for CMOS inverters fabricated on a 90 nm silicon on insulator technology. The results are measured with an optimised CMOS ring oscillator. These are believed to be the lowest gate delays reported to date for CMOS inverters at room temperature.
Keywords :
Hydrograph
Journal title :
IEE Electronics Letters
Serial Year :
2004
Journal title :
IEE Electronics Letters
Record number :
107768
Link To Document :
بازگشت