Title of article :
Reduced dimensionality in different forms of carbon Original Research Article
Author/Authors :
G. Van Tendeloo، نويسنده , , D. Bernaerts، نويسنده , , S. Amelinckx ، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1998
Abstract :
Several TEM techniques are used to characterise the local structure of low dimensional forms of carbon. HREM is particularly useful to describe the defect structure of thin films of diamond or fullerenes and C60–C70 nanoclusters. A columnar form of graphite is analysed, mainly by electron diffraction which allowed us to propose a growth mechanism. Diffraction contrast dark field microscopy, in combination with electron diffraction, allows a detailed characterisation of carbon nanotubes; e.g. the chirality distribution of tubes in ropes of single wall tubes is studied by selected area electron diffraction.
Keywords :
A. Fullerenes , D. Crystal structure , D. Microstructure , C. Transmission electron microscopy (TEM) , A. Diamond