Title of article
Focused-ion-beam assisted fabrication of individual multiwall carbon nanotube field emitter Original Research Article
Author/Authors
Guangyu Chai، نويسنده , , Lee Chow، نويسنده , , Dan Zhou، نويسنده , , Sitarum R. Byahut، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2005
Pages
5
From page
2083
To page
2087
Abstract
We report the fabrication of an individual carbon nanotube (CNT) electron field emitter using a focused-ion-beam (FIB) technique. The monolithic multiwall CNT with a graphitic shield is synthesized using chemical vapor deposition technique. The FIB technique is applied to attach the monolithic multiwall CNT on an etched tungsten tip. Field emission measurements are carried out in a vacuum of 10−7 Torr. Threshold voltage as low as 120 V has been obtained.
Keywords
Carbon nanotubes , Focused-ion-beam , Field emission
Journal title
Carbon
Serial Year
2005
Journal title
Carbon
Record number
1121232
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