Title of article
A photoelectron spectroscopy study of ion-irradiation induced defects in single-wall carbon nanotubes Original Research Article
Author/Authors
Amit K. Chakraborty، نويسنده , , R.A.J. Woolley، نويسنده , , Yu.V. Butenko، نويسنده , , V.R. Dhanak، نويسنده , , L. ?iller، نويسنده , , M.R.C. Hunt، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2007
Pages
7
From page
2744
To page
2750
Abstract
Valence band and core level photoemission spectroscopies were used to study the changes brought about by irradiation of a single-wall carbon nanotube (SWCNT) film by 3 keV Ar+ ions at room temperature. At low ion doses (low defect density) an increase in spectral intensity near the Fermi level (EF) is observed, associated with formation of localized defect-related states. These states are acceptor-like as evidenced by a shift to lower binding energy for both valence band features and the C1s core level. For large ion doses (high defect density) the spectral intensity near EF decreases, valence band features associated with delocalized π bonding disappear, and a core level component associated with sp3 bound carbon appears. This behaviour is attributed to amorphisation of the SWCNT films and occurs at ion doses consistent with those theoretically predicted.
Journal title
Carbon
Serial Year
2007
Journal title
Carbon
Record number
1122353
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