Title of article
Anomalies in thickness measurements of graphene and few layer graphite crystals by tapping mode atomic force microscopy Original Research Article
Author/Authors
P. Nemes-Incze، نويسنده , , Z. Osv?th، نويسنده , , K. Kamaras، نويسنده , , L.P. Bir?، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2008
Pages
8
From page
1435
To page
1442
Abstract
Atomic Force Microscopy (AFM) in the tapping (intermittent contact) mode is a commonly used tool to measure the thickness of graphene and few layer graphene (FLG) flakes on silicon oxide surfaces. It is a convenient tool to quickly determine the thickness
Journal title
Carbon
Serial Year
2008
Journal title
Carbon
Record number
1125723
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