Author/Authors :
Tomas Ayala-Silva، نويسنده , , Caula A. Beyl، نويسنده ,
Abstract :
In wheat (Triticum aestivum L.) plants, deficiency of an essential element may drastically affect growth, appearance, and most importantly yield. Wheat, the focus of this study, is one of the crops studied in the CELSS program. Information about nutrient deficiencies in crops grown in controlled environment is essential to optimize food productivity. The main objective of this study was to determine whether deficiency of Nitrogen (N), Phosphorus (P), Potassium (K), Calcium (Ca) and Magnesium (M) alters spectral reflectance properties of wheat leaves. Plants were grown in the greenhouse and growth chamber, in a modified Hoagland’s nutrient solution. Spectral reflectance of fully expanded wheat leaves from 280 to 1100 nm, nutrient concentrations (N, P, K, and Ca) and chlorophyll (Chl) were determined when deficiency symptoms were first evident (≈6–7 weeks). Chlorophyll content and fresh and dry weight, were used to assess the severity of the nutrient stress. All nutrient deficiencies affected chlorophyll content and generally increased reflectance in the visible (VIS) 400–700 nm and infrared (IR) 700–1100 nm ranges. Magnesium and nitrogen deficiencies had the most pronounced effect on chlorophyll concentration height, and reflectance. All macronutrient deficiencies tested reduced chlorophyll concentration, increase reflectance in the visible range and caused a shift in the position of the red edge (the point of maximum slope on the reflectance spectrum of vegetation between red and near-infrared wavelengths) toward shorter or longer wavelengths; depending upon the element.
Keywords :
Wheat , Reflectance , Spectroradiometer , Macronutrients , Remote sensing