• Title of article

    Different types of scaling in epitaxial growth Original Research Article

  • Author/Authors

    L. Brendel، نويسنده , , A. Schindler، نويسنده , , M. von den Driesch، نويسنده , , D.E. Wolf، نويسنده ,

  • Issue Information
    دوهفته نامه با شماره پیاپی سال 2002
  • Pages
    4
  • From page
    111
  • To page
    114
  • Abstract
    Simulation results for (a) interfacial alloying and (b) the Villain instability are presented. Both phenomena are important for the interface structure of epitaxial heterolayers and involve new scaling laws. For (a) a mechanism is discussed, which in a limiting case leads to a concentration profile decaying like (distance from the interface)−2. In (b) the critical film thickness is estimated, at which the Villain instability becomes important. Its scaling with the diffusion constant and the Schwoebel length can be combined with results on the strain dependence of these parameters in order to predict what kind of strains enhance or suppress the instability.
  • Keywords
    Molecular beam epitaxy , Surface diffusion , Scaling , Interface alloying
  • Journal title
    Computer Physics Communications
  • Serial Year
    2002
  • Journal title
    Computer Physics Communications
  • Record number

    1135972