Title of article :
Interfaces and stresses in thin films Original Research Article
Author/Authors :
F Spaepen، نويسنده ,
Issue Information :
دوهفته نامه با شماره پیاپی سال 2000
Abstract :
A review of the current understanding of the effect of interfaces on the intrinsic stresses in polycrystalline thin films is given. Special attention is paid to the measurement, modeling and application of surface and interface stresses. Mechanisms for generating the compressive and tensile components of the intrinsic stress are assessed. Prospects for future research are presented.
Keywords :
Interfaces , Grain boundaries , stress , Physical vapor deposition , Thin films
Journal title :
ACTA Materialia
Journal title :
ACTA Materialia