Title of article :
Analysis of a two-dimensional invariant line interface for the case of a general transformation strain and application to thin-film interfaces Original Research Article
Author/Authors :
S.Q. Xiao، نويسنده , , J.M Howe، نويسنده ,
Issue Information :
دوهفته نامه با شماره پیاپی سال 2000
Pages :
8
From page :
3253
To page :
3260
Abstract :
An explicit solution is obtained for a general two-dimensional deformation matrix between two phases containing any combination of expansion/contraction and/or shear. Application of the solution to various cases of deformation shows that in the presence of a shear, an invariant line can be obtained even when the deformations along orthogonal directions are both contractions or expansions. Utilization of the solution in the design of thin-film overgrowths on substrates and the relationship between the solution eigenvectors in real and reciprocal space are discussed.
Keywords :
Phase transformations , Properties and phenomena , Crystallography , Theory & modeling
Journal title :
ACTA Materialia
Serial Year :
2000
Journal title :
ACTA Materialia
Record number :
1139675
Link To Document :
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