Deformation and annealing of

High purity Al single crystals of the (011)[011̄] orientation have been deformed in plane strain compression in a channel die. Deformation was carried out at a strain rate of 0.01 s−1 to true strains of 0.5 and 1.0, and at temperatures of 25, 200 and 300 °C. The as-deformed microstructure has been characterized using electron backscattered diffraction (EBSD) and X-ray diffraction (XRD). No recrystallization was detected after deformation, and the deformation texture analysis showed that the stability of the orientation decreased with increasing temperature, contrary to reports for other orientations. Annealing was carried out for various times at 300 °C. Nucleation of recrystallization exhibited periodicity, with distinct bands of recrystallized grains forming parallel to the transverse direction. This recrystallized microstructure has been examined using EBSD. A model is proposed to account for the origin of the periodicity of nucleation and the retention of rods or cylinders of unrecrystallized material after significant annealing times.