Title of article
Tensile behavior of free-standing gold films. Part II. Fine-grained films Original Research Article
Author/Authors
R.D. Emery، نويسنده , , G.L. Povirk، نويسنده ,
Issue Information
دوهفته نامه با شماره پیاپی سال 2003
Pages
9
From page
2079
To page
2087
Abstract
The room temperature mechanical behavior of thin gold films (0.2–2.0 μm thickness) was investigated through uniaxial tensile testing. Films were deposited by electron beam and thermal evaporation, under varying conditions, in order to produce films with different microstructures. This particular study concentrated on the behavior of the films with grain sizes of less than about 0.5 μm. The testing showed that these fine-grained films exhibited significant strain rate dependence, in contrast with a previous study of gold films with more coarse grain sizes . The results are discussed in terms of existing theories for rate-dependent metals.
Keywords
Thin films , Tensile testing , Creep , Grain size , Grain boundary strengthening
Journal title
ACTA Materialia
Serial Year
2003
Journal title
ACTA Materialia
Record number
1140288
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