• Title of article

    Failure behavior and failure criterion of conductive cracks (deep notches) in thermally depoled PZT-4 ceramics Original Research Article

  • Author/Authors

    Tong-Yi Zhang ، نويسنده , , Tianhong Wang، نويسنده , , MingHao Zhao، نويسنده ,

  • Issue Information
    دوهفته نامه با شماره پیاپی سال 2003
  • Pages
    15
  • From page
    4881
  • To page
    4895
  • Abstract
    In the present work, we experimentally and theoretically studied the failure behavior of electrically conductive cracks (deep notches) in thermally depoled PZT-4 ceramics, which were macroscopically dielectric, under mechanical and/or electrical loading. When the critical stress intensity factor was normalized by the critical stress intensity factor under purely mechanical loading and the critical electric intensity factor was normalized by the critical electric intensity factor under purely electric loading, the experimental results revealed that the failure behavior of the conductive cracks in the ceramics was described by a quadratic function of the normalized electric intensity factor versus the normalized stress intensity factor. Accordingly, we proposed herein a charge-free zone model to predict the failure behavior, by treating dielectric ceramics as mechanically brittle and electrically ductile materials. The charge-free zone model resulted in a failure criterion, which agreed perfectly with the experimental results.
  • Keywords
    Fracture & fracture toughness , Dielectric ceramics , Conductive crack , Theory & modeling
  • Journal title
    ACTA Materialia
  • Serial Year
    2003
  • Journal title
    ACTA Materialia
  • Record number

    1140505