• Title of article

    An X-ray diffraction study on dislocation microstructure of as-prepared Al–Al2O3 composites Original Research Article

  • Author/Authors

    A.K. Deb، نويسنده , , Bishnu P. Chatterjee، نويسنده , , S.P. Sen Gupta، نويسنده ,

  • Issue Information
    دوهفته نامه با شماره پیاپی سال 2004
  • Pages
    10
  • From page
    2755
  • To page
    2764
  • Abstract
    Microstructure of α-Al2O3 containing Al-based composites were studied in terms of ab initio quasi-composite model of dislocation cell structure and ellipsoidal log-normal distribution of crystallite size. α-Al2O3, present in the composites, affects dislocation motion during stress relaxation at room temperature and may produce such a dislocation sub-structure. The region of high (∼8 × 109 cm−2) and low (∼2 × 109 cm−2) dislocation density has been characterized as cell walls and cell interiors, respectively, with compressive and tensile stresses, respectively, in accordance with the quasi-composite model. The results are in gross agreement with TEM studies.
  • Keywords
    Quasi-composite model , Dislocation cell , Al–Al2O3 composites , X-ray diffraction
  • Journal title
    ACTA Materialia
  • Serial Year
    2004
  • Journal title
    ACTA Materialia
  • Record number

    1140886