• Title of article

    Effect of substrate compliance on the global unilateral post-buckling of coatings: AFM observations and finite element calculations Original Research Article

  • Author/Authors

    G. Parry، نويسنده , , J. Colin، نويسنده , , C. Coupeau، نويسنده , , F. Foucher، نويسنده , , A. Cimetière، نويسنده , , J. Colin and J. Grilhé ، نويسنده ,

  • Issue Information
    دوهفته نامه با شماره پیاپی سال 2005
  • Pages
    7
  • From page
    441
  • To page
    447
  • Abstract
    The post-critical regime of straight-sided wrinkles on compliant substrates of polycarbonate has been observed by atomic force microscope and investigated by means of finite element simulations. The effect of coupling between the film and its substrate has revealed a global buckling phenomenon, characterized by critical loads lower than those found in the case of a rigid substrate. Characteristic shapes of the buckled structure have been also found to spread over a region wider than the delaminated zone itself. A law relating the film deflexion to the stress has finally been established for any film/substrate system.
  • Keywords
    atomic force microscopy , Thin films , Buckling , Finite element analysis
  • Journal title
    ACTA Materialia
  • Serial Year
    2005
  • Journal title
    ACTA Materialia
  • Record number

    1141193