Title of article :
MnO2 counter-electrode structure in Ta capacitors: A TEM study Original Research Article
Author/Authors :
D. Dias، نويسنده , , P.A Carvalho، نويسنده , , A.C. Ferro، نويسنده , , W. Lohwasser، نويسنده ,
Issue Information :
دوهفته نامه با شماره پیاپی سال 2005
Pages :
10
From page :
4723
To page :
4732
Abstract :
The structure of the MnO2 counter-electrode at the core of solid electrolytic tantalum capacitors has been investigated by transmission electron microscopy. The MnO2 layer presented well-crystallized grains with sizes between 100 and 200 nm. Extensive De Wolff disorder was observed within these crystallites. The structure has been identified by electron microdiffraction as randomly faulted pyrolusite, in which half ramsdellite slabs are generally isolated from each other, i.e., isolated double-chain layers are present in a single-chain matrix and no real intergrowth exists. De Wolff defects corresponding to two orientation variants can coexist in the same pyrolusite crystallite. No evidence for microtwinning on {0 1 1} or {0 3 1} planes has been found.
Keywords :
Transmission electron microscopy , Electron diffraction , Manganese dioxide , Crystalline oxides , X-ray diffraction
Journal title :
ACTA Materialia
Serial Year :
2005
Journal title :
ACTA Materialia
Record number :
1141579
Link To Document :
بازگشت