Title of article
MnO2 counter-electrode structure in Ta capacitors: A TEM study Original Research Article
Author/Authors
D. Dias، نويسنده , , P.A Carvalho، نويسنده , , A.C. Ferro، نويسنده , , W. Lohwasser، نويسنده ,
Issue Information
دوهفته نامه با شماره پیاپی سال 2005
Pages
10
From page
4723
To page
4732
Abstract
The structure of the MnO2 counter-electrode at the core of solid electrolytic tantalum capacitors has been investigated by transmission electron microscopy. The MnO2 layer presented well-crystallized grains with sizes between 100 and 200 nm. Extensive De Wolff disorder was observed within these crystallites. The structure has been identified by electron microdiffraction as randomly faulted pyrolusite, in which half ramsdellite slabs are generally isolated from each other, i.e., isolated double-chain layers are present in a single-chain matrix and no real intergrowth exists. De Wolff defects corresponding to two orientation variants can coexist in the same pyrolusite crystallite. No evidence for microtwinning on {0 1 1} or {0 3 1} planes has been found.
Keywords
Transmission electron microscopy , Electron diffraction , Manganese dioxide , Crystalline oxides , X-ray diffraction
Journal title
ACTA Materialia
Serial Year
2005
Journal title
ACTA Materialia
Record number
1141579
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