• Title of article

    Elastic properties determined from in situ X-ray diffraction Original Research Article

  • Author/Authors

    A. Cervellino، نويسنده , , P.M. Derlet، نويسنده , , H. Van Swygenhoven، نويسنده ,

  • Issue Information
    دوهفته نامه با شماره پیاپی سال 2006
  • Pages
    6
  • From page
    1851
  • To page
    1856
  • Abstract
    In situ powder diffraction experiments were performed at the Swiss Light Source MS4 beamline on specimens under tensile deformation. Evaluation of the intensity and position of several Bragg peaks as a function of the applied tensile load allows the average elastic properties of grains as well as of the macroscopic sample to be determined without the necessity of accurate macroscopic strain measurements. The feasibility of the method developed is demonstrated for polycrystalline Si.
  • Keywords
    Elastic behaviour , Nanostructure , X-ray diffraction
  • Journal title
    ACTA Materialia
  • Serial Year
    2006
  • Journal title
    ACTA Materialia
  • Record number

    1141826