• Title of article

    Lift-off phenomenon in wave soldering Original Research Article

  • Author/Authors

    K Suganuma، نويسنده , , M Ueshima، نويسنده , , I Ohnaka، نويسنده , , H Yasuda، نويسنده , , J Zhu، نويسنده , , T Matsuda، نويسنده ,

  • Issue Information
    دوهفته نامه با شماره پیاپی سال 2000
  • Pages
    7
  • From page
    4475
  • To page
    4481
  • Abstract
    The mechanism of lift-off, which is the serious defect formation that the solder fillet is peeled off from a Cu land pad on a printed wiring board in wave soldering, has been examined primarily by using basic Sn–Bi alloys (Sn at 2–5 wt%) and solidification simulation. The probability of lift-off increases with increasing Bi content. Lift-off results from the segregation of Bi, which diffuses in a short distance, in the interfacial region between a Sn–Bi alloy and a Cu land pad during dendritic structure formation. A higher fillet results in a more severe lift-off—the top side of a printed wiring board, where the fillet is low, seldom shows lift-off. The solidification simulation indicates that the solidification of the solder fillet rapidly propagates from a lead wire to a fillet edge. A Cu land acts as a heat sink, with heat flowing from the inner through-hole to the land pad. Both rapid cooling and annealing at high temperature can effectively prevent lift-off.
  • Keywords
    Lift-off phenomenon , Microstructure , Interface , computer simulation , Segregation
  • Journal title
    ACTA Materialia
  • Serial Year
    2000
  • Journal title
    ACTA Materialia
  • Record number

    1142008