• Title of article

    Spalling behavior of interfacial intermetallic compounds in Pb-free solder joints subjected to temperature cycling loading Original Research Article

  • Author/Authors

    J.W. Ronnie Teo، نويسنده , , Y.F. Sun، نويسنده ,

  • Issue Information
    دوهفته نامه با شماره پیاپی سال 2008
  • Pages
    8
  • From page
    242
  • To page
    249
  • Abstract
    Morphological evolution of interfacial intermetallic compounds (IMC) subjected to thermal cycling loading was studied numerically and experimentally. In this study, the microstructure of Sn3.5Ag0.7Cu solder joint and its interfacial IMCs were investigated using Tape Ball Grid Array assemblies. Needle-type and hemispherical-type morphologies of interfacial IMCs were formed after reflow. During temperature cycling, the IMC grains ripened into large hemispherical-type and spheroidal-type morphologies and spalled into the solder joint. Finite element analysis showed that the spalling behavior was promoted by the geometrical changes of the IMC structure and the induced cyclic shear stresses during temperature cycling loading. For needle-type grains, the stress was concentrated at the tip of the IMCs, while the maximum shear stress was redistributed to the roots of the spheroidal-type grains.
  • Keywords
    Intermetallic compounds , Interface diffusion , Spalling , Finite element analysis
  • Journal title
    ACTA Materialia
  • Serial Year
    2008
  • Journal title
    ACTA Materialia
  • Record number

    1143396