Title of article
Effect of a finite quadruple junction mobility on grain microstructure evolution: Theory and simulation Original Research Article
Author/Authors
L.A. Barrales Mora، نويسنده , , V. Mohles، نويسنده , , L.S Shvindlerman، نويسنده , , G. Gottstein، نويسنده ,
Issue Information
دوهفته نامه با شماره پیاپی سال 2008
Pages
14
From page
1151
To page
1164
Abstract
The effect of a finite quadruple junction mobility on grain growth evolution has been studied by means of computer simulations. For this purpose a special three-dimensional grain assembly is proposed, which permits a steady-state motion of the grain boundaries and junctions of the system. It was found that the behavior of the system is determined by the dimensionless parameter Λqp, which is related to the quadruple junction mobility. Numerous simulations were carried out in order to determine the effect of this parameter on grain growth. The results show that a finite quadruple junction mobility can slow down grain growth. However, the simulations also demonstrated that a finite triple line mobility hinders grain growth even more effectively.
Keywords
Theory , simulation , Grain-boundary migration , Grain growth , Modeling
Journal title
ACTA Materialia
Serial Year
2008
Journal title
ACTA Materialia
Record number
1143490
Link To Document