Growth and characterization of tetragonal bismuth ferrite–lead titanate thin films Original Research Article

Thin films of tetragonal bismuth ferrite–lead titanate (1 − x)BiFeO3–xPbTiO3 with x = 0.9–0.7 were prepared by pulsed laser deposition (PLD). The films exhibit a dense columnar grain growth. XRD analysis reveals that the films have a perovskite structure and exhibit a preferred (1 1 1) texture. The film microstructure was studied using SEM. The ferroelectric properties of the films are discussed in the light of polarization-field hysteresis behaviour and impedance spectroscopy. The remanent polarization values ranged between 2Pr ∼ 45 and ∼60 μC cm−2 at a field amplitude of 500 kV cm−1 and −10 °C, while the dielectric permittivity of the films ranged between 375 and 1096 at a frequency of 2 kHz.