• Title of article

    Effect of Pd doping on the microstructure and gas-sensing performance of nanoporous SnOx thin films Original Research Article

  • Author/Authors

    Tao Sun، نويسنده , , Suresh Donthu، نويسنده , , Michael Sprung، نويسنده , , Kenneth D’Aquila، نويسنده , , Xiao Zhang Jiang، نويسنده , , Arvind Srivastava، نويسنده , , Jin Wang، نويسنده , , Vinayak P. Dravid، نويسنده ,

  • Issue Information
    دوهفته نامه با شماره پیاپی سال 2009
  • Pages
    10
  • From page
    1095
  • To page
    1104
  • Abstract
    Pristine and Pd-doped nanoporous SnOx thin films were fabricated via a sol–gel route. The Pd-doped film exhibited enhanced H2 gas-sensing performance, in terms of higher sensitivity and shorter response time. Structural characterization was performed to investigate the effect of Pd doping on the microstructure evolution of the films. The grain and pore size of Pd-doped film, as measured using transmission electron microscopy and grazing-incidence small-angle X-ray scattering (GISAXS), are both smaller than those of undoped film. In particular, the pore size evolution of the films during annealing was quantitatively monitored in situ using synchrotron-based GISAXS. Knudsen gas diffusion and depletion layer models were employed to evaluate the microstructure influence on the gas sensitivity semi-quantitatively. The results suggest that the microstructure of the Pd-doped film is critical for improving the gas sensitivity but cannot account for the total sensitivity enhancement, implying other mechanisms could play a more important role.
  • Keywords
    Small-angle X-ray scattering , Gas sensing , Tin oxide , Sol–gel , Porous
  • Journal title
    ACTA Materialia
  • Serial Year
    2009
  • Journal title
    ACTA Materialia
  • Record number

    1144096