Title of article
Microstructure changes during non-conventional heat treatment of thin Ni–Ti wires by pulsed electric current studied by transmission electron microscopy Original Research Article
Author/Authors
R. Delville، نويسنده , , B. Malard، نويسنده , , J. Pilch، نويسنده , , P. Sittner، نويسنده , , L. Toth and D. Schryvers، نويسنده ,
Issue Information
دوهفته نامه با شماره پیاپی سال 2010
Pages
13
From page
4503
To page
4515
Abstract
Transmission electron microscopy, electrical resistivity measurements and mechanical testing were employed to investigate the evolution of microstructure and functional superelastic properties of 0.1 mm diameter as-drawn Ni–Ti wires subjected to a non-conventional heat treatment by controlled electric pulse currents. This method enables a better control of the recovery and recrystallization processes taking place during the heat treatment and accordingly a better control on the final microstructure. Using a stepwise approach of millisecond pulse annealing, it is shown how the microstructure evolves from a severely deformed state with no functional properties to an optimal nanograined microstructure (20–50 nm) that is partially recovered through polygonization and partially recrystallized and that has the best functional properties. Such a microstructure is highly resistant against dislocation slip upon cycling, while microstructures annealed for longer times and showing mostly recrystallized grains were prone to dislocation slip, particularly as the grain size exceeds 200 nm.
Keywords
Transmission electron microscopy (TEM) , Annealing , Recrystallization , Shape memory alloys (SMA) , Nanocrystalline microstructure
Journal title
ACTA Materialia
Serial Year
2010
Journal title
ACTA Materialia
Record number
1145043
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