Author/Authors :
Lyle E. Levine، نويسنده , , Peter Geantil، نويسنده , , Bennett C. Larson، نويسنده , , Jonathan Z. Tischler، نويسنده , , Michael E. Kassner، نويسنده , , Wenjun Liu، نويسنده , , Mark R. Stoudt، نويسنده , , Francesca Tavazza، نويسنده ,
Abstract :
The strength of wavy glide metals increases dramatically during deformation as dislocations multiply and entangle, forming dense dislocation wall structures. Numerous competing models have been proposed for this process but experimental validation and guidance for further model development require new experimental approaches capable of resolving local stresses within the dislocation microstructure. We use three-dimensional X-ray microscopy combining submicrometer spatial resolution with diffracted-beam masking to make direct measurements of axial elastic strain (and thus stress) in individual dislocation cell walls and their adjacent cell interiors in heavily deformed copper. These spatially resolved measurements show broad, asymmetric distributions of dipolar stresses that directly discriminate between long-standing deformation models and demonstrate that the distribution of local stresses is statistically connected to the global behavior through simple rules.
Keywords :
Synchrotron diffraction , Dislocation structure , Internal stresses , X-ray diffraction , Composite model