• Title of article

    Spectral evidence of spinodal decomposition, phase transformation and molecular nitrogen formation in supersaturated TiAlN films upon annealing Original Research Article

  • Author/Authors

    J.L. Endrino، نويسنده , , C. ?rhammar، نويسنده , , A. Gutiérrez، نويسنده , , R. Gago، نويسنده , , D. Horwat، نويسنده , , L. Soriano، نويسنده , , G. Fox-Rabinovich، نويسنده , , D. Mart?n y Marero، نويسنده , , J. Guo، نويسنده , , J.-E. Rubensson، نويسنده , , J. Andersson، نويسنده ,

  • Issue Information
    دوهفته نامه با شماره پیاپی سال 2011
  • Pages
    10
  • From page
    6287
  • To page
    6296
  • Abstract
    Thermal treatment of supersaturated Ti1−xAlxN films (x ≈ 0.67) with a dominant ternary cubic-phase were performed in the 700–1000 °C range. Grazing incidence X-ray diffraction (GIXRD) shows that, for annealing temperatures up to 800 °C, the film structure undergoes the formation of coherent cubic AlN (c-AlN) and TiN (c-TiN) nanocrystallites via spinodal decomposition and, at higher temperatures (⩾900 °C), GIXRD shows that the c-AlN phase transforms into the thermodynamically more stable hexagonal AlN (h-AlN). X-ray absorption near-edge structure (XANES) at the Ti K-edge is consistent with spinodal decomposition taking place at 800 °C, while Al K-edge and N K-edge XANES and X-ray emission data show the nucleation of the h-AlN phase at temperatures >800 °C, in agreement with the two-step decomposition process for rock-salt structured TiAlN, which was also supported by X-ray diffraction patterns and first-principle calculations. Further, the resonant inelastic X-ray scattering technique near the N K-edge revealed that N2 is formed as a consequence of the phase transformation process.
  • Keywords
    X-ray absorption near-edge structure , TiAlN , Resonant inelastic X-ray scattering , Nanocrystalline materials
  • Journal title
    ACTA Materialia
  • Serial Year
    2011
  • Journal title
    ACTA Materialia
  • Record number

    1145871