Source-based strengthening of sub-micrometer Al fibers Original Research Article

The origin of the improved mechanical properties of sub-micron single crystals and whiskers is still debated, but studies generally concentrate solely on size effects. In comparison, the role of the initial defect content, linked to the crystal size, has been given less consideration. We show using in situ SEM and TEM tensile testing of sub-micron Al fibers prepared using selective etching of a eutectic alloy that multiplication of dislocations through intermittent spiral sources directly causes a power-law increase of the yield stress with decreasing cross-sectional size. The size effect and resulting mechanical response are directly linked to the initial defect density and the distance between the source and the surface. In the absence of dislocations, fibers elastically reach high stresses with limited to no plasticity, reminiscent of whisker behavior.