• Title of article

    Expected and unexpected plastic behavior at the micron scale: An in situ μLaue tensile study Original Research Article

  • Author/Authors

    C. Kirchlechner، نويسنده , , P.J. Imrich، نويسنده , , W. Grosinger، نويسنده , , M.W. Kapp، نويسنده , , J. Keckes، نويسنده , , J.S. Micha، نويسنده , , O. Ulrich، نويسنده , , O. Thomas، نويسنده , , S. Labat، نويسنده , , C. Motz، نويسنده , , G. Dehm، نويسنده ,

  • Issue Information
    دوهفته نامه با شماره پیاپی سال 2012
  • Pages
    7
  • From page
    1252
  • To page
    1258
  • Abstract
    The study of mechanical properties in micron- and submicron-sized metal crystals raises fundamental questions about the influence of size on different aspects of plasticity. In situ characterization of the microstructure evolution during loading is necessary to understand the physics underlying crystal deformation. In situ μLaue diffraction is able to provide unique statistical information on the evolution of type and density of stored dislocations. Here we show macroscopically expected and unexpected plastic behavior at low strains, observed during in situ μLaue tensile tests on micron-sized, single slip oriented Cu samples. Regardless of the initial behavior, a steady state is reached which qualifies a technical yield criterion at the micron scale.
  • Keywords
    Dislocation , Plastic deformation , diffraction , Micromechanics
  • Journal title
    ACTA Materialia
  • Serial Year
    2012
  • Journal title
    ACTA Materialia
  • Record number

    1146137